In the SMT production process, there is a common error prevention method that can reduce the risk of wrong parts, decrease the chances of errors, and effectively improve the quality of the entire production. This method is known as FII, which stands for first item inspection.

The so-called first piece mechanism involves producing a pilot panel before official production, which undergoes comprehensive testing. Only after all tests are passed does formal production begin. The first piece production is usually carried out under the following circumstances:

1. At the start of each work shift

2. When changing operators

3. When equipment or process fixtures are replaced or adjusted (such as changing stencils, changing machine types)

4. When technical conditions, process methods, and process parameters are changed

5. After the introduction of new materials or material substitutions (such as changes in materials during the processing)

A proper first piece mechanism can ensure that the components waiting to be installed on the placement machine are correct, and that the solder paste condition and reflow oven temperature are not problematic. It can effectively prevent batch defects. The first piece mechanism is a means of pre-controlling the product production process, an important method for product process quality control, and an effective and indispensable method for enterprises to ensure product quality and improve economic efficiency.

Long-term practical experience has proven that the first inspection system is an effective measure to discover problems early and prevent batch scrapping of products. Through first piece inspection, systematic issues such as serious wear of jigs and fixtures or incorrect installation positioning, decreased precision of measuring instruments, misreading drawings, material feeding or formula errors can be identified, allowing corrective or improvement actions to be taken to prevent batch non-conforming products.

In the next new we will learn about the common testing ways which includes FII.